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GalvanoTest - ERICHSEN
Coulometric coating thickness measurement, for electroplated layers, 0.05 μm – 75 μm. Delivered and supported by Cromocol.
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Precise Coulometric Coating Thickness Measurement
Experience unparalleled precision in coating thickness measurement with the GalvanoTest, a coulometric or anodic de-plating system designed by ERICHSEN. Ideal for a wide range of electroplated coatings on substrates like steel, non-ferrous metals, and insulating materials, this system efficiently measures coatings such as nickel, zinc, tin, and silver on various bases. Its unique ability to precisely remove and analyze a minimal area of coating ensures that your substrate remains unaffected, delivering accurate and dependable results every time.
Innovative Measuring Principle
Utilizing Faraday’s law of electrolysis, the GalvanoTest dissolves a specifically delimited area of the coating to measure thickness down to the micron. A specialized measuring cell, filled with electrolyte tailored for the coating/base combination, guarantees precise and consistent layer analysis. This low-cost method is exceptional for evaluating individual layers in multi-layer systems, making GalvanoTest an industry standard for accuracy and efficiency.
Designed for User Convenience
GalvanoTest boasts a user-friendly design requiring minimal training to achieve expert results. Its compatibility with the MiniPrint data printer enables full documentation of measurements and statistical analysis, enhancing its utility for in-depth analysis. Choose between the versatile GalvanoTest 2000 or the advanced 3000 model with enhanced features for even greater efficiency and electrolyte saving in extensive de-plating processes.
Comprehensive Package
Each GalvanoTest unit comes with everything needed for immediate operation, including various electrolytes, measuring stands, and connecting cables, affirming its position as a turnkey solution for professional coating thickness measurement.
Technical Specifications
- DT /NDT: DT
- Substrate: F / NE
- Layer Thickness: up to 75 µm
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